Surface Sensitive Scattering from Thin Films

Speaker: Assunta Vigliante
Affilitation: Bruker-AXS, Karlsruhe, GERMANY

Thin films of few tenths of angstroms are becoming the staple of the electronic industry and modern scattering techniques provide a powerful tool for the basic understanding of the film microstructure. The evolution of the strain and defects as function of the film thickness, the interfacial structure between film and substrate and the effect of the reduced dimensionality will be discussed together with the correlation to the physical properties (magnetic and transport). In this talk, few representative systems are chosen from the broad category of materials (metals, oxides and organic thin films) to illustrate some of the unique features of different scattering techniques. The major techniques used are: reflectometry, grazing incidence diffraction, X-ray anomalous and magnetic scattering. The research was carried out both at synchrotron as well as standard sealed tube sources.

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