This program fits reflectivity data to a layer model of your sample. If started as reflfit, the data is from an unpolarized source. If started as reflpol, the data is from a polarized source with ABCD cross sections.
When you start the program, you can either specify a data file or a previous fit file on the command line, or you can select a data file/command file from the current directory. For polarized data with a,b,c,d cross sections, select one of the cross sections and the program will find the others. Use the gj2 ps command to restrict the subset which you are working with.
The main application window consists of a reflectivity graph and a notebook of control panels. Your first stop should be the beam characteristics to set the appropriate wavelength for your reflectivity data. Next you will need the layer menu to set the initial layers for your sample. Once you have the right number of layers, you can either modify the parameters directly from the layer table or interactively from profile graph. For complicated samples, you may have constraints between your layers. Once you have your system set up, you will spend a lot of time using fit, changing your parameters and fitting again. This program is a work in progress. Some features are only available in the underlying gj2/mlayer programs, or from the Tcl console.