X-Ray Reflectometer
Description:Location: E137 The NCNR x-ray diffractometer is configured to allow both θ/2θ diffraction and reflectometry. Typically Cu radiation is used with minimum resolution of Δλ=0.004Å and Δθ=0.0003 radians or ΔQ=0.0025Å-1. Reflectivities as low as ~10-8 have been measured. There is direct computer control using the standard ICP program. The five motions that are controlled are θ, 2θ, sample translation along an axis located 90°+θ from the incident beam, sample tilt about an axis perpendicular to the translation (all in the scattering plane), and an automated attenuator changer. Access Information:Use of the instrument is restricted to NCNR staff, however, outside users can gain access to the x-ray reflectometer through their instrument contact or NCNR staff collaborator. This x-ray instrument is self-scheduled, via a sign up calendar located at the instrument. |
Contact
Name: Sushil Satija |