College Park, Maryland      June 6 - 10 , 2004

T2-C8 (3:15 PM): Capabilities for Texture Measurements of the New Neutron Diffractometer HIPPO

S. C. Vogel (Los Alamos National Laboratory), C. Hartig (Technical University Hamburg-Harburg, 21071 Hamburg, Germany), L. Lutterotti (University of Trento, Italy; UC Berkeley, Berkeley, CA94720-4767), C.T. Necker (Los Alamos National Laboratory), R.B. Von Dreele (Los Alamos National Laboratory; Argonne National Laboratory), H.R. Wenk (UC Berkeley, Berkeley, CA94720-4767), D.J. Williams (Los Alamos National Laboratory)

In this presentation we describe the capabilities for texture measurements of the new neutron time-of-flight diffractometer HIPPO (High Pressure Preferred Orientation) at the Los Alamos Neutron Science Center (LANSCE). The orientation distribution function (ODF) is extracted from multiple neutron time-of-flight histograms using the full-pattern analysis first described by Rietveld. Both, the well-established description of the ODF using spherical harmonics functions and the WIMV method, more recently introduced for the analysis of time-of-flight data, are available to routinely derive the ODF from HIPPO data. At ambient conditions, total count time of less than 30 minutes is ample to collect sufficient data for texture analysis in most cases. The large sample throughput for texture measurements at ambient conditions possible with HIPPO requires a robust and reliable, semi-automated data analysis. HIPPO’s unique capabilities to measure large quantities of ambient condition samples and to measure texture at temperature and uniaxial stress are described. Examples for all types of texture measurements are given. We will also critically compare the ODF obtained from neutron time-of-flight data with the ODF obtained from x-ray diffraction or electron back-scatter diffraction for selected cases.

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